8N3SV76AC-0052CDI8

Programmable Timers and Oscillators Intersil (Renesas Electronics Corporation) 8N3SV76AC-0052CDI8 Overview

The Programmable Timers and Oscillators Intersil (Renesas Electronics Corporation) 8N3SV76AC-0052CDI8 is a cutting-edge IC OSC VCXO, designed to deliver a high frequency of 425 MHz in a compact 6CLCC package. Engineered for precision and stability, this voltage-controlled crystal oscillator (VCXO) stands out in the field of high-speed digital communication. Its superior design ensures minimal phase noise and excellent jitter performance, making it an ideal solution for applications requiring high-frequency, stable timing solutions. This product's robustness and precision cater to the demanding needs of modern electronic systems, embodying both innovation and reliability in high-frequency oscillator technology.

8N3SV76AC-0052CDI8 Features

This oscillator incorporates a number of advanced features including a high-frequency output up to 425 MHz, low phase noise, and a compact form factor in a 6CLCC package. The device's voltage control feature allows for fine-tuning of the output frequency, providing flexibility and enhanced performance in critical applications. Additionally, its low jitter characteristic is crucial for maintaining signal integrity in digital communication systems.

8N3SV76AC-0052CDI8 Applications

• Telecommunications: Utilized in network timing control where precise frequency modulation is necessary to manage data flow efficiently.
• Data Centers: Essential for synchronizing high-speed servers and network hardware to ensure consistent and reliable data transmission.
• Wireless Infrastructure: Supports wireless communication systems by stabilizing frequency generation, crucial for reducing signal interference and enhancing channel reliability.
• Broadcasting: Used in broadcasting equipment to maintain accurate frequency settings for clear and uninterrupted signal transmission.
• Test and Measurement Equipment: Provides the frequency precision required for calibration and testing of various electronic devices.