74LV251D,118
- Mfr.Part #
- 74LV251D,118
- Manufacturer
- NXP Semiconductors
- Package / Case
- 16-SOIC (0.154, 3.90mm Width)
- Datasheet
- Download
- Description
- IC MULTIPLEXER 1 X 8:1 16SO
- Stock
- 28,258
- In Stock :
- 28,258
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- Manufacturer :
- NXP Semiconductors
- Product Category :
- Signal Switches, Multiplexers, Decoders
- Number of Functions :
- 1
- Package / Case :
- 16-SOIC (0.154, 3.90mm Width)
- Prop. Delay@Nom-Sup :
- 45 ns
- Supply Voltage-Min (Vsup) :
- 1V
- Independent Circuits :
- 1
- Current - Output High, Low :
- 6mA 6mA
- JESD-609 Code :
- e4
- Max I(ol) :
- 0.006 A
- Surface Mount :
- yes
- Power Supplies :
- 3.3V
- Type :
- Multiplexer
- Terminal Position :
- Dual
- Operating Temperature :
- -40°C~125°C
- Qualification Status :
- Not Qualified
- Terminal Form :
- Gull wing
- Supply Voltage :
- 3.3V
- Width :
- 3.9mm
- Packing Method :
- Tape and Reel
- Number of Outputs :
- 1
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Series :
- 74LV
- Length :
- 9.9mm
- Published :
- 1998
- Number of Terminations :
- 16
- Supply Voltage-Max (Vsup) :
- 3.6V
- Mounting Type :
- Surface Mount
- Family :
- LV/LV-A/LVX/H
- Output Characteristics :
- 3-STATE
- Output Polarity :
- Complementary
- Load Capacitance :
- 50pF
- Time@Peak Reflow Temperature-Max (s) :
- 30
- Voltage - Supply :
- 1V~3.6V
- Number of Inputs :
- 8
- Voltage Supply Source :
- Single Supply
- Terminal Finish :
- NICKEL PALLADIUM GOLD
- Circuit :
- 1 x 8:1
- Packaging :
- Tape and Reel (TR)
- Peak Reflow Temperature (Cel) :
- 260
- Pin Count :
- 16
- Base Part Number :
- 74LV251
- RoHS Status :
- ROHS3 Compliant
- Propagation Delay (tpd) :
- 54 ns
- Datasheets
- 74LV251D,118

Signal Switches, Multiplexers, Decoders NXP Semiconductors 74LV251D,118 Overview
The 74LV251D,118, manufactured by NXP Semiconductors, is an integrated circuit multiplexer designed to meet the demands of modern electronic systems. This versatile component offers a compact solution for signal switching applications, providing reliable performance and efficient operation.
Featuring a 1 x 8:1 configuration, the 74LV251D,118 allows for the selection of one of eight data inputs to be routed to a single output. With its 16-pin small-outline package (SO), this IC is space-saving and ideal for densely populated PCB layouts.
Engineered with high-quality materials and advanced semiconductor technology, this multiplexer ensures consistent signal integrity and minimal signal distortion, making it suitable for a wide range of industrial and commercial applications.
74LV251D,118 Features
- 1 x 8:1 multiplexer configuration
- Compact 16-pin small-outline package (SO)
- High-quality construction for reliable performance
- Advanced semiconductor technology
- Minimal signal distortion
- Wide operating voltage range
- Low power consumption
- RoHS compliant
74LV251D,118 Applications
- Data acquisition systems: The 74LV251D,118 is utilized in data acquisition systems to multiplex multiple analog signals into a single output, enabling efficient data processing and analysis. Its compact size and low power consumption make it ideal for portable and battery-operated devices.
- Communication networks: In communication networks, this multiplexer facilitates the selection and routing of various data streams, optimizing signal transmission and enhancing network performance. Its high-speed operation and reliable signal integrity ensure seamless communication in diverse applications.
- Industrial automation: The 74LV251D,118 plays a critical role in industrial automation by enabling the efficient control and monitoring of multiple sensors and actuators. Its robust design and wide operating voltage range make it suitable for harsh industrial environments, ensuring reliable performance in demanding applications.
- Test and measurement equipment: This multiplexer is widely used in test and measurement equipment to streamline the measurement process and improve testing efficiency. Its precise signal routing capabilities and low signal distortion contribute to accurate measurement results in various testing scenarios.
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