74HCT4351D,118
- Mfr.Part #
- 74HCT4351D,118
- Manufacturer
- NXP Semiconductors
- Package / Case
- 20-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- NOW NEXPERIA 74HCT4351D - SINGLE
- Stock
- 1,998
- In Stock :
- 1,998
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- Manufacturer :
- NXP Semiconductors
- Product Category :
- Analog Switches, Multiplexers, Demultiplexers
- Analog IC - Other Type :
- SINGLE-ENDED MULTIPLEXER
- Supply Voltage :
- 4.5V
- Voltage - Supply, Single/Dual (±) :
- 4.5V~5.5V ±1V~5V
- On-State Resistance (Max) :
- 120Ohm
- Operating Supply Voltage :
- 5V
- Bandwidth :
- 170MHz
- Base Part Number :
- 74HCT4351
- Lead Free :
- Lead Free
- Off-state Isolation-Nom :
- 50 dB
- Packaging :
- Tape and Reel (TR)
- Current - Leakage (IS(off)) (Max) :
- 100nA
- Power Dissipation :
- 500mW
- Pin Count :
- 20
- Radiation Hardening :
- No
- Factory Lead Time :
- 4 Weeks
- Channel Capacitance (CS(off), CD(off)) :
- 3.5pF
- Min Supply Voltage :
- 4.5V
- Channel-to-Channel Matching (ΔRon) :
- 6 Ω
- Logic Function :
- Demultiplexer, Multiplexer
- On-state Resistance Match-Nom :
- 9Ohm
- Mounting Type :
- Surface Mount
- Turn On Delay Time :
- 75 ns
- Resistance :
- 160Ohm
- Height Seated (Max) :
- 2.65mm
- Min Dual Supply Voltage :
- 1V
- Number of Channels :
- 8
- RoHS Status :
- ROHS3 Compliant
- Package / Case :
- 20-SOIC (0.295, 7.50mm Width)
- Dual Supply Voltage :
- 2.5V
- Number of Functions :
- 1
- Number of Terminations :
- 20
- Peak Reflow Temperature (Cel) :
- 260
- Max Dual Supply Voltage :
- 5V
- Number of Pins :
- 20
- Published :
- 1997
- Number of Circuits :
- 1
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Supply Type :
- Dual, Single
- JESD-609 Code :
- e4
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Terminal Form :
- Gull wing
- Multiplexer/Demultiplexer Circuit :
- 8:1
- Propagation Delay :
- 6 ns
- Mount :
- Surface Mount
- Switch Time (Ton, Toff) (Max) :
- 35ns, 23ns
- Max Power Dissipation :
- 500mW
- Operating Supply Current :
- 400nA
- Operating Temperature :
- -40°C~125°C TA
- Max Supply Voltage :
- 5.5V
- Time@Peak Reflow Temperature-Max (s) :
- 30
- Turn-Off Delay Time :
- 65 ns
- Datasheets
- 74HCT4351D,118

Analog Switches, Multiplexers, Demultiplexers NXP Semiconductors 74HCT4351D,118 Overview
The Analog Switches, Multiplexers, Demultiplexers NXP Semiconductors 74HCT4351D,118 represents a pinnacle of precision and versatility in the modern electronic component market. This device is crafted by NXP Semiconductors, now branded under Nexperia, ensuring high-quality and reliable performance. The 74HCT4351D,118 is particularly designed for advanced signal routing and is well-suited for various challenging applications that require high-speed switching and low power dissipation. Its robust design is adaptable to both digital and analog signals, making it an ideal choice for a wide range of industrial and commercial electronic systems.
74HCT4351D,118 Features
This product boasts several features that make it an essential component in any electronics toolkit. It includes eight channels with single-pole single-throw (SPST) analog switches, which facilitate efficient data transfer and signal control across multiple paths. The device also operates with a wide voltage range and provides low power dissipation, combined with high noise immunity characteristic of the CMOS technology. Enhanced durability and reliability are assured with its latch-up performance meeting 100mA per JESD 78, Class II level testing.
74HCT4351D,118 Applications
- Data Acquisition Systems: In these systems, the 74HCT4351D,118 can be used to switch between different sensor inputs, enabling accurate monitoring and control.
- Signal Routing in Audio and Video Equipment: Utilizes its low on-resistance and high-bandwidth capabilities to manage audio and video signals without degradation.
- Communication Equipment: Facilitates the distribution and multiplexing of communication signals, thereby enhancing the performance of communication networks.
- Test Equipment: In testing setups, this switch aids in the routing of signals from the device under test to measuring instruments, ensuring high precision and flexibility in test configurations.
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