74HC4052DB,112
- Mfr.Part #
- 74HC4052DB,112
- Manufacturer
- NXP Semiconductors
- Package / Case
- 16-SSOP (0.209, 5.30mm Width)
- Datasheet
- Download
- Description
- IC MUX/DEMUX DUAL 4X1 16SSOP
- Stock
- 5
- In Stock :
- 5
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- Manufacturer :
- NXP Semiconductors
- Product Category :
- Analog Switches, Multiplexers, Demultiplexers
- Operating Supply Current :
- 320µA
- Neg Supply Voltage-Nom (Vsup) :
- -4.5V
- Radiation Hardening :
- No
- Propagation Delay :
- 15 ns
- Current - Leakage (IS(off)) (Max) :
- 2µA
- Switch Circuit :
- SP4T
- Base Part Number :
- 74HC4052
- Terminal Pitch :
- 0.65mm
- Switch-off Time-Max :
- 57ns
- Max Power Dissipation :
- 500mW
- Min Dual Supply Voltage :
- 1V
- Terminal Form :
- Gull wing
- Bandwidth :
- 180MHz
- Resistance :
- 210Ohm
- Packaging :
- Tube
- Published :
- 2010
- RoHS Status :
- ROHS3 Compliant
- Logic Function :
- Demultiplexer, Multiplexer
- Power Dissipation :
- 500mW
- Analog IC - Other Type :
- DIFFERENTIAL MULTIPLEXER
- Package / Case :
- 16-SSOP (0.209, 5.30mm Width)
- Peak Reflow Temperature (Cel) :
- 260
- Mount :
- Surface Mount
- JESD-609 Code :
- e4
- Number of Circuits :
- 2
- Supply Type :
- Dual, Single
- Number of Pins :
- 16
- Time@Peak Reflow Temperature-Max (s) :
- 30
- Number of Channels :
- 8
- Supply Voltage :
- 4.5V
- Mounting Type :
- Surface Mount
- Max Supply Voltage :
- 10V
- Multiplexer/Demultiplexer Circuit :
- 4:1
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Pin Count :
- 16
- Operating Supply Voltage :
- 5V
- Voltage - Supply, Single/Dual (±) :
- 2V~10V ±1.5V~5V
- Switch Time (Ton, Toff) (Max) :
- 58ns, 48ns
- Factory Lead Time :
- 13 Weeks
- Channel-to-Channel Matching (ΔRon) :
- 6 Ω
- Channel Capacitance (CS(off), CD(off)) :
- 3.5pF
- Turn-Off Delay Time :
- 74 ns
- Switch-on Time-Max :
- 69ns
- Number of Terminations :
- 16
- Number of Functions :
- 1
- Dual Supply Voltage :
- 2.5V
- On-State Resistance (Max) :
- 150Ohm
- Turn On Delay Time :
- 105 ns
- Operating Temperature :
- -40°C~125°C TA
- Crosstalk :
- -60dB @ 1MHz
- Min Supply Voltage :
- 2V
- On-state Resistance Match-Nom :
- 6Ohm
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Max Dual Supply Voltage :
- 5V
- Off-state Isolation-Nom :
- 50 dB
- Datasheets
- 74HC4052DB,112

Analog Switches, Multiplexers, Demultiplexers NXP Semiconductors 74HC4052DB,112 Overview
The Analog Switches, Multiplexers, Demultiplexers NXP Semiconductors 74HC4052DB,112 is a high-performance, dual 4-channel analog multiplexer and demultiplexer designed to handle multiple signal management tasks with precision and efficiency. Crafted by NXP Semiconductors, a leader in the semiconductor industry, this IC offers excellent voltage handling capabilities and low power dissipation, making it ideal for integrating into advanced electronic systems. Its versatility in signal routing makes it suitable for a broad range of applications, from data acquisition systems to communication devices, ensuring reliable operation and enhanced system performance.
74HC4052DB,112 Features
The 74HC4052DB,112 features dual 4-channel multiplexing capability, allowing it to efficiently manage multiple input and output analog signals. Its broad voltage range (2V to 10V) supports various power environments, making it adaptable to both low and high-voltage applications. The low on-resistance of this IC minimizes signal distortion, while its high noise immunity ensures clean and stable signal paths. Additionally, the 74HC4052DB,112 is offered in a compact 16-SSOP package, which is optimal for space-constrained applications.
74HC4052DB,112 Applications
- Data Acquisition Systems: Utilizes its multiplexing capability to switch between different sensor inputs, thereby streamlining data gathering processes.
- Analog Signal Routing: Efficiently routes audio or video signals in consumer electronics, ensuring minimal signal degradation and high fidelity.
- Communication Devices: Applies its demultiplexing features to manage multiple communication channels, enhancing device functionality and connectivity.
- Test Equipment: Used in electronic testing environments to alternate between test signals and analyze equipment performance.
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