74ABT18640DGGRG4
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- Mfr.Part #
- 74ABT18640DGGRG4
- Manufacturer
- Texas Instruments
- Package / Case
- 56-TFSOP (0.240, 6.10mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE 56TSSOP
- Stock
- 32,468
- In Stock ：
- 32,468
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Mount :
- Surface Mount
- Output Polarity :
- INVERTED
- Additional Feature :
- SCANNABLE
- Mounting Type :
- Surface Mount
- Number of Ports :
- 2
- Package / Case :
- 56-TFSOP (0.240, 6.10mm Width)
- Direction :
- Bidirectional
- RoHS Status :
- ROHS3 Compliant
- Number of Functions :
- 2
- Radiation Hardening :
- No
- Translation :
- n/a
- Lead Free :
- Lead Free
- Propagation Delay (tpd) :
- 5.4 ns
- Packing Method :
- Tape and Reel
- Max I(ol) :
- 0.064 A
- Weight :
- 252.792698mg
- Output Characteristics :
- 3-STATE
- Height Seated (Max) :
- 1.2mm
- Family :
- ABT
- Number of Terminations :
- 56
- Logic Type :
- Scan Test Device with Inverting Bus Transceivers
- Control Type :
- COMMON CONTROL
- Logic Function :
- Inverting, Transceiver
- Series :
- 74ABT
- Operating Temperature :
- -40°C~85°C
- Pin Count :
- 56
- Operating Supply Voltage :
- 5.5V
- Supply Voltage :
- 4.5V~5.5V
- Prop. Delay@Nom-Sup :
- 5.4 ns
- Terminal Form :
- Gull wing
- Terminal Pitch :
- 0.5mm
- Width :
- 6.1mm
- Terminal Position :
- Dual
- Power Supplies :
- 5V
- Base Part Number :
- 74ABT18640
- Number of Pins :
- 56
- Packaging :
- Tape and Reel (TR)
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Number of Bits :
- 18
- Length :
- 14mm
- Datasheets
- 74ABT18640DGGRG4
Specialty Logic Texas Instruments 74ABT18640DGGRG4 Overview
Introducing the cutting-edge IC SCAN TEST DEVICE 56TSSOP, meticulously crafted by Texas Instruments, a pioneer in integrated circuits innovation. This high-performance device stands as a testament to the relentless pursuit of excellence in the realm of electronic components.
Designed to meet the exacting standards of modern industrial applications, this scan test device embodies precision engineering, reliability, and efficiency. Its compact form factor and advanced features make it an indispensable tool for electronics testing and quality assurance.
With its unparalleled performance and Texas Instruments' renowned quality assurance, the 74ABT18640DGGRG4 sets a new benchmark for excellence in the realm of specialty logic integrated circuits.
74ABT18640DGGRG4 Features
- Highly efficient scan test device
- 56-pin TSSOP package for compact integration
- Precision engineering ensures reliable performance
- Designed for industrial-grade testing applications
- Optimized for compatibility with diverse electronic systems
- Robust construction ensures durability in harsh environments
74ABT18640DGGRG4 Applications
- Automotive Electronics: The 74ABT18640DGGRG4 facilitates comprehensive testing of automotive electronic control units (ECUs), ensuring optimal performance and reliability in vehicles.
- Telecommunications Equipment: Deployed in telecommunications infrastructure, this scan test device verifies the integrity of circuitry in networking equipment, enhancing network stability and performance.
- Industrial Automation: Integrated into industrial automation systems, this device enables thorough testing of control modules and PLCs, ensuring seamless operation of manufacturing processes.
- Medical Devices: Utilized in medical device manufacturing, the 74ABT18640DGGRG4 guarantees the quality and reliability of critical electronic components in healthcare equipment, enhancing patient safety.
- Aerospace Systems: Trusted by aerospace engineers, this scan test device verifies the functionality of avionics systems, ensuring compliance with stringent safety and performance standards in aircraft.
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