5962-9318601M3A
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- Mfr.Part #
- 5962-9318601M3A
- Manufacturer
- Texas Instruments
- Package / Case
- Datasheet
- Download
- Description
- SN54ABT8245 SCAN TEST DEVICES WI
- Stock
- 1
- In Stock ：
- 1
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- Manufacturer :
- Texas Instruments
- Product Category :
- Buffers, Drivers, Receivers, Transceivers
- Number of Bits :
- 8
- Min Supply Voltage :
- 4.5 V
- Quiescent Current :
- 30 mA
- Min Operating Temperature :
- -55 °C
- Max Supply Voltage :
- 5.5 V
- Propagation Delay :
- 5.1 ns
- Product Status :
- Active
- Max Operating Temperature :
- 125 °C
- Length :
- 11.43 mm
- Series :
- *
- RoHS Status :
- RoHS Compliant
- Lead Free :
- Contains Lead
- High Level Output Current :
- -24 mA
- Logic Function :
- Transceiver
- Polarity :
- Non-Inverting
- Mount :
- Surface Mount
- Height :
- 2.03 mm
- Number of Pins :
- 28
- Contact Plating :
- Lead, Tin
- Manufacturer Lifecycle Status :
- ACTIVE (Last Updated: 6 days ago)
- Width :
- 11.43 mm
- Radiation Hardening :
- No
- RoHS :
- Compliant
- Output Type :
- TTL
- Lifecycle Status :
- Production (Last Updated: 6 days ago)
- Package :
- Tube
- Direction :
- Bidirectional
- Number of Outputs :
- 8
- Operating Supply Voltage :
- 5 V
- Low Level Output Current :
- 48 mA
- Thickness :
- 1.83 mm
- Datasheets
- 5962-9318601M3A
Buffers, Drivers, Receivers, Transceivers Texas Instruments 5962-9318601M3A Overview
The Texas Instruments 5962-9318601M3A part of the Buffers, Drivers, Receivers, Transceivers category, represents a state-of-the-art solution for scan testing devices within the semiconductor industry. Designed to meet rigorous testing and performance standards, this IC is engineered for high reliability and precision. The SN54ABT8245 model is specifically optimized for applications requiring efficient data transfer and signal integrity. As an essential component in advanced electronic systems, this product leverages Texas Instruments' long-standing expertise in integrated circuit technology, making it an ideal choice for businesses seeking robust performance in their electronic applications.
5962-9318601M3A Features
This integrated circuit boasts a suite of features that enhance its utility in scan test devices, including high-speed bidirectional communication capabilities, low power consumption, and an improved interface for testing. The robust design ensures that the SN54ABT8245 is capable of operating under extended industrial temperature ranges, which is critical for varied testing environments.
5962-9318601M3A Applications
- Automated Test Equipment (ATE): Utilizes the device's bidirectional communication capabilities to facilitate efficient data exchange, ensuring high-speed testing and reliability in manufacturing quality control.
- Data Communication Systems: Employs its high-speed interfacing to enhance signal integrity and reduce latency in critical communication infrastructure.
- Embedded Systems: Benefits from the low power consumption and high reliability of the SN54ABT8245 to perform in various embedded applications where stability and endurance are paramount.
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