100141DC
- Mfr.Part #
- 100141DC
- Manufacturer
- National Semiconductor
- Package / Case
- -
- Datasheet
- Download
- Description
- PARALLEL IN/OUT, 100K SERIES
- Stock
- 3,151
- In Stock :
- 3,151
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- Manufacturer :
- National Semiconductor
- Product Category :
- Gates and Inverters - Multi-Function, Configurable
- Datasheets
- 100141DC

Gates and Inverters - Multi-Function, Configurable National Semiconductor 100141DC Overview
The Gates and Inverters - Multi-Function, Configurable National Semiconductor 100141DC is a high-performance, parallel in/out logic device part of the robust 100K series. This product is specifically designed to meet the demanding needs of sophisticated digital systems. With its ability to handle multiple configurations and versatile application capabilities, the 100141DC from National Semiconductor ensures reliable performance and integration flexibility. This device is an ideal solution for designers looking for efficient, high-speed logic operations in their circuit designs, emphasizing the reduction of propagation delays and power consumption.
100141DC Features
- Parallel Input/Output Configuration: Facilitates faster data processing and throughput.
- Part of the 100K Series: Ensures high reliability and durability under varying operational conditions.
- Optimized for low power consumption: Suitable for power-sensitive applications.
- High-speed performance: Minimizes delay times, enhancing overall system efficiency.
100141DC Applications
- High-Speed Computing Systems: The 100141DC can be utilized in the design of microprocessor or microcontroller based systems, where fast and reliable logic operations are critical.
- Data Communication Equipment: Suitable for use in data communication infrastructure where parallel data processing is necessary for high throughput.
- Signal Processing: Integral in systems requiring fast signal manipulation and processing, enhancing both performance and reliability of signal integrity.
- Automated Test Equipment: Provides the needed speed and reliability for logic testing in automated setups, ensuring accurate and efficient testing processes.
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